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OOF - Calculate macroscopic properties from images of microstructures

'OOF' helps materials scientists calculate macroscopic properties from images of real or simulated microstructures. It consists of two cooperating parts: 'ppm2oof' and 'oof'. 'ppm2oof' reads images in the ppm (Portable Pixel Map) format and assigns material properties to features in the image. 'oof' conducts virtual experiments on the data structures created by ppm2oof to determine the macroscopic properties of the microstructure.

There are now two separate versions of OOF available. The original version solves elasticity problems. The new thermal version solves elasticity and thermal diffusion problems. Plans are to include eventually include electric and magnetic field calculations as well.

Obtaining

Web pagehttp://www.ctcms.nist.gov/oof/index.html
Source tarballhttp://www.ctcms.nist.gov/cgi-bin/registersw.pl?file=/~langer/OOFdownload/SRC/oof-dist1.030.tar.gz
Source informationhttp://www.ctcms.nist.gov/oof/download/
Version 1.030 (stable) released on 2002-03-29
Licensed under GPL.
This is not a GNU package.

Documentation

User manual available in HTML format from http://www.ctcms.nist.gov/oof/download/Manual/Manual.html; User manual available in PDF format from http://www.ctcms.nist.gov/oof/download/Manual.ps.gz
Support contacts

Help List<oof_manager@ctcms.nist.gov>
Developer List<oof_manager@ctcms.nist.gov>
Bug List<oof_manager@ctcms.nist.gov>

Project contacts

Maintainers
Developers
Sponsors
  • National Institute of Standards and Technology

Related information

InterfacesX Window System
Programsppm2oof, oof
Source languagesC++

Entry information

License verified byJanet Casey <jcasey@gnu.org> on 2003-07-11
Entry compiled byJanet Casey <jcasey@gnu.org>

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